Statistical Modeling/Inference

Physics-based Noise Modeling for Extreme Low-light Photography

*IEEE Transactions on Pattern Analysis and Machine Intelligence (**TPAMI**), 2021*

A Physics-based Noise Formation Model for Extreme Low-light Raw Denoising

*The 36th IEEE Conference on Computer Vision and Pattern Recognition **(CVPR 2020)**, Seattle, USA,* **Oral Presentation, Acceptance Rate: 5%**